Raman Mapping Devoted to the Phase Transformation and Strain Analysis in Si Micro-Indentation

✍ Scribed by F. Demangeot; P. Puech; V. Domnich; Y.G. Gogotsi; S. Pinel; P.S. Pizani; R.G. Jasinevicius

• Publisher: John Wiley and Sons
• Year: 2002
• Tongue: English
• Weight: 311 KB
• Volume: 4
• Category: Article
• ISSN: 1438-1656
• DOI: 10.1002/1527-2648(20020806)4:8<543::aid-adem543>3.0.co;2-i