✦ LIBER ✦
Raman characterization before and after rapid thermal annealing of CeO2 thin films grown by rf sputtering on (111) Si
✍ Scribed by Y. Guhel; M. T. Ta; J. Bernard; B. Boudart; J. C. Pesant
- Publisher
- John Wiley and Sons
- Year
- 2009
- Tongue
- English
- Weight
- 240 KB
- Volume
- 40
- Category
- Article
- ISSN
- 0377-0486
- DOI
- 10.1002/jrs.2140
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