๐”– Bobbio Scriptorium
โœฆ   LIBER   โœฆ

Radioactive implant induced X-ray emission

โœ Scribed by J.R. Joyce; A.O. Sanni; E.A. Schweikert


Publisher
Elsevier Science
Year
1982
Weight
304 KB
Volume
193
Category
Article
ISSN
0167-5087

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Synchrotron radiation-induced x-ray emission (SRIXE) is now a proven analytical method for the determination of trace elements. It is notable for spatial resolutions of less than 10 lm and minimum detection limits that can be as low as 1 ppm by weight. The approach to SRIXE measurements in use at th