Radiation testing of electronics for the CMS endcap muon system

✍ Scribed by Bylsma, B.; Cady, D.; Celik, A.; Durkin, L.S.; Gilmore, J.; Haley, J.; Khotilovich, V.; Lakdawala, S.; Liu, J.; Matveev, M.; Padley, B.P.; Roberts, J.; Roe, J.; Safonov, A.; Suarez, I.; Wood, D.; Zawisza, I.

• Book ID: 119333271
• Publisher: Elsevier Science
• Year: 2013
• Tongue: English
• Weight: 614 KB
• Volume: 698
• Category: Article
• ISSN: 0168-9002
• DOI: 10.1016/j.nima.2012.09.017