Radiation-stimulated failure mechanism in a dielectrically isolated integrated circuit : J. L. Azarewicz and T. F. Wrobel. Proc. IEEE 24th Electronic Components Conference, Washington D.C. 48 (13–15 May 1975)

• Publisher: Elsevier Science
• Year: 1975
• Tongue: English
• Weight: 117 KB
• Volume: 14
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(75)90336-4