Radiation Response of Bipolar Transistors at Various Irradiation Temperatures and Electric Biases: Modeling and Experiment

✍ Scribed by Zebrev, G.I.; Pavlov, D.Y.; Pershenkov, V.S.; Nikiforov, A.Y.; Sogoyan, A.V.; Boychenko, D.V.; Ulimov, V.N.; Emelyanov, V.V.

• Book ID: 120085423
• Publisher: IEEE
• Year: 2006
• Tongue: English
• Weight: 538 KB
• Volume: 53
• Category: Article
• ISSN: 0018-9499
• DOI: 10.1109/TNS.2006.877851