๐”– Bobbio Scriptorium
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Radiation-Induced Second Breakdown in Transistors

โœ Scribed by Carr, E. A.; Binder, D.


Book ID
117928442
Publisher
IEEE
Year
1969
Tongue
English
Weight
741 KB
Volume
16
Category
Article
ISSN
0018-9499

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Second breakdown in MOS transistors
โœ Asakawa, T.; Tsubouchi, N. ๐Ÿ“‚ Article ๐Ÿ“… 1966 ๐Ÿ› IEEE ๐ŸŒ English โš– 293 KB