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Radiation-induced degradation of polyethersulphone films studied by fluorescent X-ray emission spectroscopy

✍ Scribed by E.Z. Kurmaev; R.P. Winarski; K. Endo; T. Ida; A. Moewes; D.L. Ederer; J.-C. Pivin; S.N. Shamin; V.A. Trofimova; Yu.M. Yarmoshenko

Book ID: 114171512
Publisher: Elsevier Science
Year: 1999
Tongue: English
Weight: 218 KB
Volume: 155
Category: Article
ISSN: 0168-583X
DOI: 10.1016/s0168-583x(99)00463-2

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