Radiation-induced defects and processes on the surface of radiation detector oxides according to exoelectron emission data

✍ Scribed by I. V. Krylova

• Book ID: 110164595
• Publisher: SP MAIK Nauka/Interperiodica
• Year: 2007
• Tongue: English
• Weight: 292 KB
• Volume: 41
• Category: Article
• ISSN: 0018-1439
• DOI: 10.1134/s0018143907050050