✦ LIBER ✦
Radiation hardness of static random-access-memory tested using dose-to-failure and gamma-ray exposure
✍ Scribed by Kuei-Shu Chang-Liao; Kuang-Hsien Feng
- Book ID
- 114555709
- Publisher
- IEEE
- Year
- 1998
- Tongue
- English
- Weight
- 360 KB
- Volume
- 47
- Category
- Article
- ISSN
- 0018-9529
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