Radiation Effects on Integrated Circuits and Systems for Space Applications

✍ Scribed by Raoul Velazco, Dale McMorrow, Jaime Estela

• Publisher: Springer International Publishing
• Year: 2019
• Tongue: English
• Leaves: 402
• Edition: 1st ed.
• Category: Library

✦ Synopsis

This book provides readers with invaluable overviews and updates of the most important topics in the radiation-effects field, enabling them to face significant challenges in the quest for the insertion of ever-higher density and higher performance electronic components in satellite systems. Readers will benefit from the up-to-date coverage of the various primary (classical) sub-areas of radiation effects, including the space and terrestrial radiation environments, basic mechanisms of total ionizing dose, digital and analog single-event transients, basic mechanisms of single-event effects, system-level SEE analysis, device-level, circuit-level and system-level hardening approaches, and radiation hardness assurance. Additionally, this book includes in-depth discussions of several newer areas of investigation, and current challenges to the radiation effects community, such as radiation hardening by design, the use of Commercial-Off-The-Shelf (COTS) components in space missions, CubeSats and SmallSats, the use of recent generation FPGA’s in space, and new approaches for radiation testing and validation. The authors provide essential background and fundamentals, in addition to information on the most recent advances and challenges in the sub-areas of radiation effects.

• Provides a concise introduction to the fundamentals of radiation effects, latest research results, and new test methods and procedures;
  
• Discusses the radiation effects and mitigation solutions for advanced integrated circuits and systems designed to operate in harsh radiation environments;
  
• Includes coverage of the impact of Small Satellites in the space industry.
  

✦ Table of Contents

Front Matter ....Pages i-ix
Space Environments (Marcelo Famá, Jaime Estela)....Pages 1-11
System-Level Modeling and Analysis of the Vulnerability of a Processor to Single-Event Upsets (SEUs) (Marwan Ammar, Ghaith Bany Hamad, Otmane Ait Mohamed, Yvon Savaria)....Pages 13-38
Single-Event Effects Test Methods (Konstantin Tapero)....Pages 39-60
Characteristics and Applications of Pulsed Laser-Induced Single-Event Effects (Dale McMorrow)....Pages 61-81
Microprocessor Testing (Heather Quinn)....Pages 83-125
Fault Injection Methodologies (Luis Entrena, Mario García-Valderas, Almudena Lindoso, Marta Portela-Garcia, Enrique San Millán)....Pages 127-144
Error Rate Prediction of Applications Implemented in Multi-Core and Many-Core Processors (Pablo Ramos, Vanessa Vargas, Raoul Velazco, Nacer-Eddine Zergainoh)....Pages 145-173
Improving Reliability of Multi-/Many-Core Processors by Using NMR-MPar Approach (Vanessa Vargas, Pablo Ramos, Jean-Francois Méhaut, Raoul Velazco)....Pages 175-203
System Hardening and Real Applications (Michel Pignol)....Pages 205-247
Mitigation Transient Faults by Backward Error Recovery in SRAM-FPGA (Fakhreddine Ghaffari, Olivier Romain, Bertrand Granado)....Pages 249-276
Development of a Hardened 150 nm Standard Cell Library (João Baptista S. Martins, Jorge Johanny Sáenz Noval)....Pages 277-300
COTS in Space: Constraints, Limitations and Disruptive Capability (Michel Pignol, Florence Malou, Corinne Aicardi)....Pages 301-327
COTS and the NewSpace (Jaime Estela)....Pages 329-346
The Phoenix GPS Receiver for Rocket and Satellite Applications: An Example for the Successful Utilization of COTS Technology in Space Projects (Markus Markgraf)....Pages 347-367
Simulation-Based Radiation Hardness Assurance for ATHENA-WFI (M. Plattner, S. Ott)....Pages 369-380
COTS for Deep Space Missions (Hans-Juergen Sedlmayr, A. Beyer, K. Joehl, K. Kunze, M. Maier, T. Obermeier)....Pages 381-401

✦ Subjects

Engineering; Circuits and Systems; Signal, Image and Speech Processing; Electronics and Microelectronics, Instrumentation