This volume provides an extensive overview of radiation effects on integrated circuits, offering major guidelines for coping with radiation effects on components. It contains a set of chapters based on the tutorials presented at the International School on Effects of Radiation on Embedded Systems fo
Radiation Effects on Embedded Systems
โ Scribed by Raoul Velazco, Pascal Fouillat, Ricardo Reis
- Year
- 2007
- Tongue
- English
- Leaves
- 272
- Edition
- 1
- Category
- Library
No coin nor oath required. For personal study only.
โฆ Synopsis
This volume provides an extensive overview of radiation effects on integrated circuits, offering major guidelines for coping with radiation effects on components. It contains a set of chapters based on the tutorials presented at the International School on Effects of Radiation on Embedded Systems for Space Applications (SERESSA) that was held in Manaus, Brazil, November 20-25, 2005.
โฆ Table of Contents
Contents......Page 5
Preface......Page 7
Radiation Space Environment......Page 9
Radiation Effects in Microelectronics......Page 18
In-flight Anomalies on Electronic Devices......Page 37
Multi-Level Fault Effects Evaluation......Page 75
Effects of Radiation on Analog and Mixed-Signal Circuits......Page 95
Fundamentals of the Pulsed Laser Technique for Single-Event Upset Testing......Page 126
Design Hardening Methodologies for ASICs......Page 147
Fault Tolerance in Programmable Circuits......Page 165
Automatic Tools for Design Hardening......Page 186
Test Facilities for SEE and Dose Testing......Page 204
Error Rate Prediction of Digital Architectures: Test Methodology and Tools......Page 236
Using the SEEM Software for Laser SET Testing and Analysis......Page 262
Index......Page 272
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