Radiation damage studies with STAR silicon drift detectors

✍ Scribed by Takahashi, J.; Bellwied, R.; Beuttenmueller, R.; Chen, W.; Dezillie, B.; Eremin, V.; Elliot, D.; Hoffmann, G.W.; Huang, W.; Humanic, T.; Ilyashenko, I.; Kotov, I.V.; Kuczewski, P.; Leonhardt, W.; Li, Z.; Lynn, D.; Pandey, S.U.; Schambach, J.; Soja, R.; Sugarbaker, E.; Zhao, L.J.; Willson, R.M.

• Book ID: 126728132
• Publisher: IEEE
• Year: 2000
• Tongue: English
• Weight: 383 KB
• Volume: 47
• Category: Article
• ISSN: 0018-9499
• DOI: 10.1109/23.856715