Radiation Damage Effects of Electrons and H, He, O, Cl and Cu Ions on GaAs JFETs

✍ Scribed by Knudson, A. R.; Campbell, A. B.; Stapor, W. J.; Shapiro, P.; Mueller, G. P.; Zuleeg, R.

• Book ID: 114663206
• Publisher: IEEE
• Year: 1985
• Tongue: English
• Weight: 709 KB
• Volume: 32
• Category: Article
• ISSN: 0018-9499
• DOI: 10.1109/tns.1985.4334129