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Radiation damage and copper distribution in 14 MeV copper-ion-implanted nickel — TEM and AEM analyses in cross-section

✍ Scribed by L.M. Wang; R.A. Dodd; G.L. Kulcinski


Publisher
Elsevier Science
Year
1989
Tongue
English
Weight
954 KB
Volume
29
Category
Article
ISSN
0304-3991

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