RA system using process failure analysis for ICs : A. Takaide and N. Manabe. Proc. IEEE Reliab. Maintainab. Symp., Philadelphia (Jan. 18–20, 1977) p. 1

• Publisher: Elsevier Science
• Year: 1977
• Tongue: English
• Weight: 135 KB
• Volume: 16
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(77)90166-4