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Quick derivation of high-power thermal resistance values of HBTs using an existing measurement technique and a theoretical formula

✍ Scribed by C. L. Tan; P. Hui; Beiping Yan; Hong Wang; Haiqun Zheng; Hong Yang; K. Radhakrishnan


Publisher
John Wiley and Sons
Year
2001
Tongue
English
Weight
99 KB
Volume
30
Category
Article
ISSN
0895-2477

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✦ Synopsis


Abstract

A method is presented for the quick derivation of high‐power thermal resistance values using an existing measurement technique and a theoretical formula. It first derives the low‐power thermal resistance value, and then substitutes this value into the general form for the dependence of thermal resistance derived using the Kirchhoff transformation. © 2001 John Wiley & Sons, Inc. Microwave Opt Technol Lett 30: 287–289, 2001.