Questionability of drift-diffusion transport in the analysis of small semiconductor devices : P. Rohr, F. A. Lindholm and K. R. Allen. Solid St. Electron.17, 729 (1974)

• Publisher: Elsevier Science
• Year: 1974
• Tongue: English
• Weight: 128 KB
• Volume: 13
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(74)90406-5