Quasi-elastic X-ray scattering divergence analysis calculation

✍ Scribed by John S. Reid; Gordon J. Milne

• Book ID: 103044595
• Publisher: Elsevier Science
• Year: 1989
• Tongue: English
• Weight: 824 KB
• Volume: 55
• Category: Article
• ISSN: 0010-4655
• DOI: 10.1016/0010-4655(89)90067-2

✦ Synopsis

FORTRAN 77 program is described that enables a numerical investigation to be made of the variation of instrumental resolution corrections with apparatus configuration for quasi-elastic X-ray scattering. The program is useful for scattering from phonons, defects, low angle Compton processes and all instances where the energy change on scattering is at most a small fraction of the incident energy. Account can be taken of an irregular incident beam distribution (in angle and in space), a sample crystal mosaic spread and a finite area detector. The numerical convolutions for each smearing effect are performed separately but cumulatively, allowing the effects of individual processes to be investigated or treated in variant fashion. The program provides a shell of organisation that could be adapted to related problems.