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Quantum yield of current carriers excited by electron beams and electron penetration depth in thin GaP films

โœ Scribed by Azimov, S. A. ;Aronov, D. A. ;Rubinov, V. M. ;Tuichiev, M.

Publisher
John Wiley and Sons
Year
1983
Tongue
English
Weight
275 KB
Volume
75
Category
Article
ISSN
0031-8965

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