Quantum yield measurement

• Book ID: 104417856
• Publisher: Elsevier Science
• Year: 2005
• Tongue: English
• Weight: 387 KB
• Volume: 8
• Category: Article
• ISSN: 1369-7021
• DOI: 10.1016/s1369-7021(05)71317-1

✦ Synopsis

Software gets upgrade FEI has launched new software and hardware for its Tecnai™ G2 transmission electron microscope (TEM). Tecnai 3.0 operating software takes full digital control of the microscope and all its detectors. It enhances the system stability and performance, making operation easier, and reducing the time taken to achieve high quality data. The package includes a new version of TEM Imaging and Analysis (TIA) software with enhanced image and data processing. The software now supports and embeds a wider range of CCD cameras. The hardware includes a new Inspect3D Xpress computer-based tomography reconstruction package that speeds up quality realignment and threedimensional image reconstruction.