Quantum Transport Simulation of Strain and Orientation Effects in Sub-20 nm Silicon-on-Insulator FinFETs

✍ Scribed by Keng-Ming Liu; Register, L.F.; Banerjee, S.K.

• Book ID: 114620237
• Publisher: IEEE
• Year: 2011
• Tongue: English
• Weight: 891 KB
• Volume: 58
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/ted.2010.2084090