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Quantum mechanical effects on noise properties of nanoelectronic devices: application to Monte Carlo simulation

✍ Scribed by Oriols, X.


Book ID
114617183
Publisher
IEEE
Year
2003
Tongue
English
Weight
442 KB
Volume
50
Category
Article
ISSN
0018-9383

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## Abstract This study describes the framework of the quantum mechanical (QM)/Monte Carlo (MC)/free‐energy perturbation (FEP) method, a FEP method based on MC simulations using quantum chemical calculations. Because a series of structures generated by interpolating internal coordinates between tran