Quantum Hall Resistance Standards With Good Quantization at High Electron Mobilities

✍ Scribed by Pierz, K.; Gotz, M.; Pesel, E.; Ahlers, F.-J.; Schumacher, H.W.

• Book ID: 114632056
• Publisher: IEEE
• Year: 2011
• Tongue: English
• Weight: 431 KB
• Volume: 60
• Category: Article
• ISSN: 0018-9456
• DOI: 10.1109/tim.2010.2100651