Quantitative XPS: non-destructive analysis of surface nano-structures
β Scribed by Sven Tougaard
- Publisher
- Elsevier Science
- Year
- 1996
- Tongue
- English
- Weight
- 757 KB
- Volume
- 100-101
- Category
- Article
- ISSN
- 0169-4332
No coin nor oath required. For personal study only.
π SIMILAR VOLUMES
The accuracy of XPS and AES quantiΓcation by peak shape analysis was established from a detailed analysis of a range of model spectra and three sets of experiments. It was found that information on the concentration-depth proΓle in the surface region up to depths of (where is the inelastic electron
PolyoleΓn surfaces and interfaces can have a substantial e β ect on polyoleΓn processing and properties. Despite the importance of these surfaces and interfaces, there have been few good ways of determining the type of polyoleΓn on a surface. In this work, a quantitative XPS method for the determinat