Quantitative XPS Measurements of Some Oxides, Sulphides and Complex Minerals
✍ Scribed by McIntyre, N. S.; Davidson, R. D.; Mycroft, J. R.
- Publisher
- John Wiley and Sons
- Year
- 1996
- Tongue
- English
- Weight
- 576 KB
- Volume
- 24
- Category
- Article
- ISSN
- 0142-2421
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✦ Synopsis
A number of binary oxides, sulphide compounds and complex minerals have been analysed by x-ray photoelectron spectroscopy to give the relative intensities of major photoelectron lines. Where possible, compound surfaces were prepared by fracturing in vacuo or in inert gas to avoid contamination. Alternatively, some of these compounds have undergone a mild thermal treatment in vacuo to remove much of the surface contamination which normally affects such intensity measurements. The experimental line intensity ratios were corrected only by their particular photoelectron cross-section and inelastic mean free paths. For most oxides and complex minerals studied, good agreement is obtained with the expected stoichiometry, particularly when using photoelectron lines of higher kinetic energy. This tends to support the use of a simple background approximation when measuring specifically with those oxides involving non-transition elements. The sulphides studied mostly involved transition metals ; agreement between calculated and actual stoichiometry was only modest. Some differences in measured surface stoichiometry occurred as a result of the ambient conditions within which the fracture was made; fracture in vacuo produced a different S/M ratio than did fracture in an inert gas environment.