Quantitative X-ray Diffraction Analysis and Modeling of the Crystallization Process in Amorphous Si–B–C–N Polymer-Derived Ceramics

✍ Scribed by Amir Hossein Tavakoli; Peter Gerstel; Jerzy Andrzej Golczewski; Joachim Bill

• Book ID: 109262861
• Publisher: John Wiley and Sons
• Year: 2010
• Tongue: English
• Weight: 699 KB
• Volume: 93
• Category: Article
• ISSN: 0002-7820
• DOI: 10.1111/j.1551-2916.2009.03591.x