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Quantitative trait locus mapping for Verticillium wilt resistance in a backcross inbred line population of cotton (Gossypium hirsutum

✍ Scribed by Fang, Hui; Zhou, Huiping; Sanogo, Soum; Flynn, Robert; Percy, Richard G.; Hughs, Sidney E.; Ulloa, Mauricio; Jones, Don C.; Zhang, Jinfa

No coin nor oath required. For personal study only.

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