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Quantitative texture measurement on thin wires

✍ Scribed by Langouche, F. ;Aernoudt, E. ;Van Houtte, P.

Book ID: 114500286
Publisher: International Union of Crystallography
Year: 1989
Tongue: English
Weight: 508 KB
Volume: 22
Category: Article
ISSN: 0021-8898
DOI: 10.1107/s002188988900748x

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