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Quantitative temperature profiling through null-point scanning thermal microscopy

✍ Scribed by Chung, J.; Kim, K.; Hwang, G.; Kwon, O.; Choi, Y.K.; Lee, J.S.


Book ID
118459172
Publisher
Elsevier Science
Year
2012
Tongue
French
Weight
459 KB
Volume
62
Category
Article
ISSN
1290-0729

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