Quantitative interface roughness analysi
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R. Schad; P. Belien; G. Verbanck; K. Temst; V.V. Moshchalkov; Y. Bruynseraede; H
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Article
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1998
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Elsevier Science
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English
⚖ 130 KB
The quantitative characterization of the interface roughness of Fe/Cr superlattices is necessary for the understanding of the transport properties of such structures. This must include both vertical and lateral roughness components. The information can be obtained by specular and off-specular X-ray