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Quantitative prediction of acceptor concentration reduction in boron doped silicon due to electron irradiation

✍ Scribed by J.L. Everaert; F. Verhaegen; R.L. Van Meirhaeghe; J. Uyttenhove; F. Cardon


Book ID
113288005
Publisher
Elsevier Science
Year
1996
Tongue
English
Weight
542 KB
Volume
117
Category
Article
ISSN
0168-583X

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