Quantitative measurement of residual biaxial stress by Raman spectroscopy in diamond grown on a Ti alloy by chemical vapor deposition

✍ Scribed by Ager, Joel W.; Drory, Michael D.

• Book ID: 127200847
• Publisher: The American Physical Society
• Year: 1993
• Tongue: English
• Weight: 450 KB
• Volume: 48
• Category: Article
• ISSN: 1098-0121
• DOI: 10.1103/physrevb.48.2601