✦ LIBER ✦
Quantitative internal thermal energy mapping of semiconductor devices under short current stress using backside laser interferometry
✍ Scribed by Pogany, D.; Bychikhin, S.; Furbock, C.; Litzenberger, M.; Gornik, E.; Groos, G.; Esmark, K.; Stecher, M.
- Book ID
- 114616897
- Publisher
- IEEE
- Year
- 2002
- Tongue
- English
- Weight
- 617 KB
- Volume
- 49
- Category
- Article
- ISSN
- 0018-9383
No coin nor oath required. For personal study only.