Quantitative inheritance of yield and associated factors in spring wheat
โ Scribed by P. D. Walton
- Publisher
- Springer
- Year
- 1972
- Tongue
- English
- Weight
- 276 KB
- Volume
- 21
- Category
- Article
- ISSN
- 0014-2336
No coin nor oath required. For personal study only.
โฆ Synopsis
A diallel cross between five spring wheat cultivars was used to study the inheritance of yield, its components, certain developmental stages and morphological structures above the flag leaf node. Jn all cases additive genetic variance formed the major part of the genetic variance present. Dominance was, however, present for yield and for three yield components as well as for ear volume, flag leaf length and extrusion length. Dominance effects were also evident in the inheritance of the three stages of development studied.
๐ SIMILAR VOLUMES
Three partially resistant spring wheat cultivars, with a long latency period were crossed among each other and with the highly susceptible Little Club, with a very short latency period . Parents, F3 and F5 plants have been inoculated with the leaf rust race Flamingo in the young flag leaf stage to d
Crosses were made between the highly susceptible Little Club and the partially resistant cultivars Westphal 12A, Akabozu and BH 1146 to obtain F1, F2 and backcross generations . Latency period (LP) was determined in plants inoculated at the young flag leaf stage with a monospore culture of race `Fla