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Quantitative HRTEM analysis of FIB prepared specimens

โœ Scribed by M. BARAM; W.D KAPLAN

Book ID
108866570
Publisher
John Wiley and Sons
Year
2008
Tongue
English
Weight
892 KB
Volume
232
Category
Article
ISSN
0022-2720

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A site-specific technique for cross-section transmission electron microscopy specimen preparation of difficult materials is presented. A focused ion beam was used to slice an electron transparent membrane from a specific area of interest within a bulk sample. Micromanipulation lift-out procedures we