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Quantitative evaluation of the oxygen content in YBa2Cu3O7−δ epitaxially grown thin films using near-infrared excited Raman spectrometry

✍ Scribed by B. Güttler; H.L. Dewing; R.N. Basu; D. Schiel


Publisher
Elsevier Science
Year
1995
Tongue
English
Weight
408 KB
Volume
251
Category
Article
ISSN
0921-4534

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