Quantitative determination of the charge density on surface steps on semiconductors by high-resolution local scanning-tunneling spectroscopy

✍ Scribed by M. Kemerink; T.C.G. Reusch; D.M. Bruls; P.M. Koenraad; H.W.M. Salemink; J.H. Wolter

• Publisher: Elsevier Science
• Year: 2002
• Tongue: English
• Weight: 128 KB
• Volume: 13
• Category: Article
• ISSN: 1386-9477
• DOI: 10.1016/s1386-9477(02)00326-0