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Quantitative determination of oxygen in silicon by combination of FTIR-spectroscopy, inert gas fusion analysis and secondary ion mass spectroscopy

✍ Scribed by G. Stingeder; S. Gara; S. Pahlke; H. Schwenk; E. Guerrero; M. Grasserbauer


Book ID
112376629
Publisher
Springer
Year
1989
Tongue
English
Weight
710 KB
Volume
333
Category
Article
ISSN
1618-2650

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