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Quantitative description of dark current-voltage characteristics of multicrystalline silicon solar cells based on lock-in thermography measurements

✍ Scribed by Breitenstein, Otwin ;Khanna, Ankit ;Warta, Wilhelm


Publisher
John Wiley and Sons
Year
2010
Tongue
English
Weight
442 KB
Volume
207
Category
Article
ISSN
0031-8965

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✦ Synopsis


Abstract

A model is introduced which divides a solar cell locally into a ‘baseline’ region, showing a homogeneous exponential characteristic with a low ideality factor, and local ‘shunt’ regions which additionally show an inhomogeneous depletion region recombination current with a high, locally varying ideality factor. By measuring only three lock‐in thermograms and the corresponding currents at one reverse and two different forward biases, the local ohmic contributions, the positions of the shunt regions, the diode parameters of the baseline region, and the local diode parameters of the shunt regions are obtained. Based on these data a good fit of dark current–voltage characteristics of real solar cells over the whole bias range is obtained. These data may be used in a local network model of the cell. magnified image

Measured dark IV characteristic (squares) and characteristic simulated from evaluating three lock‐in thermograms (line).