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Quantitative correlations between the performance of polysilicon emitter transistors and the evolution of polysilicon/silicon interfacial oxides upon annealing
✍ Scribed by Ajuria, S.A.; Gan, C.H.; Noel, J.A.; Reif, L.R.
- Book ID
- 114534634
- Publisher
- IEEE
- Year
- 1992
- Tongue
- English
- Weight
- 924 KB
- Volume
- 39
- Category
- Article
- ISSN
- 0018-9383
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