𝔖 Bobbio Scriptorium
✦   LIBER   ✦

Quantitative characterization of electron micrograph image using fractal feature

✍ Scribed by Chan, K.L.


Book ID
114530088
Publisher
IEEE
Year
1995
Tongue
English
Weight
615 KB
Volume
42
Category
Article
ISSN
0018-9294

No coin nor oath required. For personal study only.


πŸ“œ SIMILAR VOLUMES