Quantitative atomic force microscopy analysis of slip traces in Ni3Al yield stress anomaly

✍ Scribed by Joël Bonneville; Christophe Coupeau

• Book ID: 103842364
• Publisher: Elsevier Science
• Year: 2008
• Tongue: English
• Weight: 394 KB
• Volume: 483-484
• Category: Article
• ISSN: 0921-5093
• DOI: 10.1016/j.msea.2006.12.158

✦ Synopsis

It is well known that Ni 3 Al intermetallic compounds of the L1 2 ordered structure exhibit positive temperature dependence of yield stress over a finite temperature range. In this work, we examined the slip markings produced by plastic deformation at the free surface of Ni 3 (Al,Hf) specimens deformed in situ under an atomic force microscope at room temperature. The results demonstrate that a high exhaustion in the mobile dislocation density does take place in the yield-stress anomaly of this alloy.