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Quantitative analysis of W(N), TiW and TiW(N) matrices using XPS, AES, RBS, EPMA and XRD

✍ Scribed by J. L. Alay; H. Bender; G. Brijs; A. Demesmaeker; W. Vandervorst


Book ID
104592738
Publisher
John Wiley and Sons
Year
1991
Tongue
English
Weight
967 KB
Volume
17
Category
Article
ISSN
0142-2421

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