Quantitative analysis of oxide films on ODS-alloys using MCs+-SIMS and e-beam SNMS

✍ Scribed by J. -P. Pfeifer; H. Holzbrecher; W. J. Quadakkers; U. Breuer; W. Speier

• Book ID: 112290681
• Publisher: Springer
• Year: 1993
• Tongue: English
• Weight: 654 KB
• Volume: 346
• Category: Article
• ISSN: 1618-2650
• DOI: 10.1007/bf00321410