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Quantitative analysis of nanoscale switching in SrBi[sub 2]Ta[sub 2]O[sub 9] thin films by piezoresponse force microscopy

✍ Scribed by Kalinin, Sergei V.; Gruverman, Alexei; Bonnell, Dawn A.

Book ID: 127071340
Publisher: American Institute of Physics
Year: 2004
Tongue: English
Weight: 467 KB
Volume: 85
Category: Article
ISSN: 0003-6951
DOI: 10.1063/1.1775881

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