In the x-ray microΓuorescence analysis of particles, the characteristic line intensity depends not only on the chemical composition of the sample, but also on the x-ray beam proΓle, particle size, shape and orientation. In previous work, optical measurements of particle dimensions were required to d
β¦ LIBER β¦
Quantitative analysis of intensitities in X-ray topographs by enhanced microfluorescence
β Scribed by Weissmann, S. ;Greenhut, V. A. ;Chaudhuri, J. ;Kalman, Z. H.
- Book ID
- 114499596
- Publisher
- International Union of Crystallography
- Year
- 1983
- Tongue
- English
- Weight
- 514 KB
- Volume
- 16
- Category
- Article
- ISSN
- 0021-8898
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