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Quantitative analysis of grain boundary properties in a generalized phase field model for grain growth in anisotropic systems

โœ Scribed by Moelans, N.; Blanpain, B.; Wollants, P.

Book ID
115494284
Publisher
The American Physical Society
Year
2008
Tongue
English
Weight
755 KB
Volume
78
Category
Article
ISSN
1098-0121

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AbstractรDiusion induced grain boundary migration (DIGM) in the Cu(Zn) system was experimentally studied by Li and Hillert using polycrystalline Cu specimens zinciยฎed with binary CuยฑZn alloys containing 3.9ยฑ30.5 wt% of Zn at temperatures between 573 and 773 K. Their experimental results have been qu