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Quantitative analysis of ferroelectric domain imaging with piezoresponse force microscopy

โœ Scribed by Jungk, Tobias; Hoffmann, Akos; Soergel, Elisabeth


Book ID
115494777
Publisher
American Institute of Physics
Year
2006
Tongue
English
Weight
320 KB
Volume
89
Category
Article
ISSN
0003-6951

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Piezoresponse force microscopy (PFM) has evolved into a useful tool for measurement of local properties of piezoelectric materials with great potential in applications such as data storage, ferroelectric lithography and nonvolatile memories. In order to utilize PFM for low dimensional materials char