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Quantitative analysis of atomic disorders in full-Heusler Co[sub 2]FeSi alloy thin films using x-ray diffraction with Co Kα and Cu Kα sources

✍ Scribed by Takamura, Yota; Nakane, Ryosho; Sugahara, Satoshi


Book ID
125435743
Publisher
American Institute of Physics
Year
2010
Tongue
English
Weight
423 KB
Volume
107
Category
Article
ISSN
0021-8979

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